XT H 320 LC X-ray source: Superior accuracy and performance through proprietary 225 or 320kV micro-focus X-ray source
The default 225kV microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability.
The 320kV microfocus source is used to penetrate through larger or denser samples.
Regardless of the target of choice, the XT H LC system uses an open-tube X-ray source that guarantees a lower cost-of-ownership.
X-ray source with rotating reflection target: Rotating reflection target multiplies X-ray flux
Traditional X-ray sources using fixed targets can only receive a limited flux of electrons to avoid damaging the target. By introducing a rotating reflection target that yields much better cooling performance, the electron flux on the rotating target radically increases without the risk for permanent damage. This boosts X-ray flux by a large factor, and enables customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span
By establishing up to 5 times more X-ray flux, customers can either speed up data acquisition by a similar factor or increase data accuracy by taking more radiographs in the same time.
Stunning images from internal structures
A small spot size and a high-resolution flat panel create sharp images. Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.
XTH320: Easy access to inspect larger parts
The XT H LC systems feature a large access door and the heavyduty precision 5-axis manipulator can hold samples in excess of 50kg with dimensions of 0.6m (H) x 0.6m (D).
Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. Continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation.
Configuration of System: Configure the system to your specific needs
Specific applications require more detailed images or higher accuracy. XT H 320 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs.
|Microfocus source||Max. kV||Max. power||Focal spot size||Focal spot size at max power||XT H 320|
|225 kV Reflection target||225 kV||225 W||3 µm up to 7 W||225 µm at 225 W||
|225 kV Rotating target option||225 kV||450 W||10 µm up to 30 W||113 µm at 450 W||
|320 kV Reflection target||320 kV||320 W||30 µm up to 30 W||300 µm at 320 W||
|Detectors||# Bits||Active pixels||Pixel Size||Max. frame rate at 1x1 binning||Max. frame rate at 2x2 binning|
|Varian 2520 (1)||14-bit||1900 x 1516||127 µm||7.5 fps||15 fps|
|Perkin Elmer 0820||14-bit||1000 x 1000||200 µm||7.5 fps||15 fps|
|Perkin Elmer 1620||16-bit||2000 x 2000||200 µm||3.75 fps||7.5 fps|
|Perkin Elmer 1621 EHS||16-bit||2000 x 2000||200 µm||15 fps||30 fps|
PE162x & CLDA
|Configuration with both Flat panel and
Curved Linear Diode Array detector
(1) only with 225 kV source
|# Axes||4 (optional 5th axis)|
|Axes travel||(X) 510 mm
(Y) 610 mm
(Z) 800 mm
|Max. sample weight||100kg|
|Cabinet dimensions (LxWxH)||2,695 mm x 1,828 mm x 2,249 mm|
|Safety||All systems are manufactured to IRR99|
|Control software||All systems are controlled by Nikon Metrology’s in-house Inspect-X software|