Superior accuracy and performance through proprietary 225kV microfocus X-ray source
The default microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability. Regardless of the target of choice, the XT H 225 system uses an open-tube X-ray source that guarantees a lower cost-of-ownership
Stunning images from internal structures
A small spot size and a high-resolution flat panel create sharp images. Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.
High performance processing
The core of the processing power is situated in the XT software suite that builds on Nikon Metrology’s track record of improving sample throughput and simplifying operation to take the systems out of the hands of experts and into the hands of users. XT Software also brings the fastest reconstruction of CT data currently available on a single PC. This PC is built from standard components to aid serviceability. The sample throughput can be improved further by the use of additional PCs. The complete system is also readyfor any market leading CT visualisation and processing software, such as VolumeGraphics.
Easy operation and automation
Users are operational with the system within a few days days of training. A CT wizard guides operators through the data acquisition process.
Customisable macros automate the measurement workflow, and tight integration with industry-standard post-processing applications streamline the decision making process.
Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. There is continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation
Low cost of ownership
The open X-ray tube allows for local maintenance of internal tube components. The 3-wheel transportation incorporated allows the system to easily be manoeuvred through double-door entries. Also no special floor treatment is required to install XT H 225.
Configure the system to your specific needs
Specific applications require more detailed images or higher accuracy. XT H 225 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs.
XT H 225ST system is an extended version to hold larger samples up to 50kg with a diameter of about 50cm.
|Microfocus source||Max. kV||Max. power||Focal spot size||Focal spot size|
at max power
|180kV Transmission target||180 kV||10 W||1 µm up to 3 W||10 µm at 10 W|
|225 kV Reflection target||225 kV||225 W||3 µm up to 7 W||225 µm at 225 W|
|225 kV Rotating target option||225 kV||450 W||10 µm up to 30 W||113 µm at 450 W|
|Detectors||# Bits||Active pixels||Pixel Size||Max. frame rate|
at 1x1 binning
|Max. frame rate|
at 2x2 binning
|Varian 2520||14-bit||1900 x 1516||127 µm||7.5 fps||15 fps|
|Varian 4030||14-bit||2300 x 3200||127 µm||3 fps||7 fps|
|Perkin Elmer 0820||16-bit||1000 x 1000||200 µm||7.5 fps||15 fps|
|Perkin Elmer 1620||16-bit||2000 x 2000||200 µm||3.75 fps||7.5 fps|
|Perking Elmer 1621 EHS||16-bit||2000 x 2000||200 µm||15 fps||30 fps|
|Axes travel||(X) 450 mm
(Y) 350 mm
(Z) 750 mm
(Tilt) +/- 30
|Max. sample weight||50kg|
|Cabinet dimensions (LxWxH)||2,414 mm x 1,275 mm x 2,202 mm|
|Safety||All systems are manufactured to IRR99|
|Control software||All systems are controlled by Nikon Metrology’s in-house Inspect-X software|