X-Sight Technology
Industrial CT / Inspection Technologies
Technology
Industrial CT and X-ray Patented Technology
Our systems are packed with pioneering technology unique to us.
From our Integral Generators to the world’s only 750kV Microfocus x-ray source, Nikon Metrology X-ray products offers the broadest range of the most technologically advanced x-ray solutions to all industry challenges from microchips to archaeology.
Integral Generator
Patented TechnologyRotating Anode
World’s first microfocal rotating anode320kV Active Module
320kV Active Module450kV Active Module
World’s first 450kV microfocal source - now with rotating targetUltrafocus Target
High Power Ultrafocus TargetNanotech Target
Utlimate in resolutionOpen Source Technology
unique open source design
Integral Generator
Patented Technology
Nikon Metrology’s patented range of Integral Generators offer bullet-proof reliability and fast, precise control of x-ray parameters. The technology means that the x-ray source can be manoeuvred with respect to the sample, giving unrivalled viewing angles, and reducing cabinet weight and footprint.
View productsRotating Anode
World’s first microfocal rotating anode
Nikon Metrology offers the world’s only microfocal rotating target. This unique design allows up to 5 times more x-ray flux, giving excellent signal to noise ratio and increasing CT inspection throughput.
View products320kV Active Module
320kV Active Module
Nikon Metrology’s active 320kV module can be interchanged with one of the passive x-ray targets to increase x-ray penetration up to 320kV at high x-ray flux. It is ideal for the penetration of denser samples such as castings, rock cores and fossils.
View products450kV Active Module
450kV Active Module
Nikon Metrology’s 450kV module can be interchanged with one of the passive x-ray targets to increase x-ray penetration up to 450kV at high x-ray flux. This is ideal for turbine blade and weld inspection especially when used with a line array detector.
View productsUltrafocus Target
High Power Ultrafocus Target
The Nikon Metrology high power Ultrafocus target offers high x-ray flux for good signal to noise and is the only reflection target of its kind offering multiple target materials selectable without breaking vacuum. Target material can be selected to give optimised imaging depending on the sample.
View productsNanotech Target
Nanotech Target
Nikon Metrology’s range of Nanotech targets offers unrivalled resolution down to 100 nanometres without compromising x-ray flux, and allows high geometric magnification. Nanotech targets are readily interchangeable with the Ultrafocus targets when very high resolution is required.
View productsOpen Source Technology
unique open source design
Nikon Metrology’s unique open source design reduces the long-term cost of ownership, enabling customers to maintain their x-ray sources themselves using cost-effective, readily available consumables. This makes the lifetime of the source effectively unlimited. In addition, this open source design allows different x-ray targets to be interchanged on the same x-ray source. This means customers are able to migrate from microfocal to nanofocal resolution by simply changing the x-ray target, without the need for a new system or cabinet. In this way Nikon Metrology can offer a complete x-ray laboratory within one system cabinet.
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