Industrial CT and X-ray Patented Technology
Our systems are packed with pioneering technology unique to us.
From our Integral Generators to the world’s only 750kV Microfocus x-ray source, Nikon Metrology X-ray products offers the broadest range of the most technologically advanced x-ray solutions to all industry challenges from microchips to archaeology.
Nikon Metrology’s patented range of Integral Generators offer bullet-proof reliability and fast, precise control of x-ray parameters. The technology means that the x-ray source can be manoeuvred with respect to the sample, giving unrivalled viewing angles, and reducing cabinet weight and footprint.
View productsNikon Metrology offers the world’s only microfocal rotating target. This unique design allows up to 5 times more x-ray flux, giving excellent signal to noise ratio and increasing CT inspection throughput.
View productsNikon Metrology’s active 320kV module can be interchanged with one of the passive x-ray targets to increase x-ray penetration up to 320kV at high x-ray flux. It is ideal for the penetration of denser samples such as castings, rock cores and fossils.
View productsNikon Metrology’s 450kV module can be interchanged with one of the passive x-ray targets to increase x-ray penetration up to 450kV at high x-ray flux. This is ideal for turbine blade and weld inspection especially when used with a line array detector.
View productsThe Nikon Metrology high power Ultrafocus target offers high x-ray flux for good signal to noise and is the only reflection target of its kind offering multiple target materials selectable without breaking vacuum. Target material can be selected to give optimised imaging depending on the sample.
View productsNikon Metrology’s range of Nanotech targets offers unrivalled resolution down to 100 nanometres without compromising x-ray flux, and allows high geometric magnification. Nanotech targets are readily interchangeable with the Ultrafocus targets when very high resolution is required.
View productsNikon Metrology’s unique open source design reduces the long-term cost of ownership, enabling customers to maintain their x-ray sources themselves using cost-effective, readily available consumables. This makes the lifetime of the source effectively unlimited. In addition, this open source design allows different x-ray targets to be interchanged on the same x-ray source. This means customers are able to migrate from microfocal to nanofocal resolution by simply changing the x-ray target, without the need for a new system or cabinet. In this way Nikon Metrology can offer a complete x-ray laboratory within one system cabinet.
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